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The family of dielectric resonators for precise measurements of electromagnetic properties of materials
at microwave frequencies
QWED manufactures several types of resonators (also referred to as test fixtures) for precise measurements of electromagnetic properties of materials at microwave frequencies. Each resonator is equipped with specialised software for extracting the relevant data (typically, complex permittivity or real permittivity and loss tangent) from measurements. The resonators and the accompanying software are based on years of research led by QWED's expert Prof. Jerzy Krupka and documented in dozens of worldwide-appreciated scientific and technical publications. The quality of the resonators has been recognised by industrial practitioners, leading researchers, and industrial standard creators. QWED is especially proud of recognition by Agilent Technologies... read more
Split post dielectric resonators (SPDR)
SPDRs are intended for the measurements of the complex permittivity of laminar dielectric materials including LTCC substrates, but also thin ferroelectric films deposited on low loss dielectric substrates.



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Gallery of split post dielectric resonators
Single post dielectric resonators (SiPDR)
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One of the single post dielectric resonators
TE01δ mode dielectric resonator
TE01δ mode dielectric resonator technique is intended for very precise complex permittivity measurements of bulk low loss disc or cylinder shape dielectric ceramics.



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One of the TE01δ dielectric resonators
 
Award Certificate for Prof. Jerzy Krupka for the invention of Resonators for Precise Measurements of Electromagnetic Properties of Materials at Microwave Frequencies
The family of dielectric resonators
 
Award Certificate for Prof. Jerzy Krupka
Split post dielectric resonators (SPDR)
Single post dielectric resonators (SiPDR)
 
 
 
QWED offers standard reference materials for dielectric measurements. For example, samples of single crystal quartz can be ordered by interested customers, either in conjunction with a resonator purchase or independently. Samples of anisotropic substrates are also available.
Standard reference materials
Standard reference materials
 
Recommendation by Agilent Technology
TE01δ mode dielectric resonator 
Diplomas for Prof. Jerzy Krupka
Diplomas for Prof. Jerzy Krupka
 
SiPDRs are intended for the measurements of the surface impedance of metamaterials and resistive films as well as for the contact-less measurements of the conductivity of semiconductor wafers. Range of thin film materials that can be measured includes resistive layers, thin metal films and conductive polymer films with the surface resistance Rs < 20 kΩ/square.






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Resonators for graphene measurements
Resonators for graphene measurements
 
QWED resonators for measurements of graphene are commercially available.

Investigation of graphene properties has been a hot subject in the world's scientific community for the last couple of years. In October 2010, the interest in the subject was additionally fuelled by the Nobel Prize in Physics awarded jointly to Andre Geim and Konstantin Novoselov "for groundbreaking experiments regarding the two-dimensional material graphene".
QWED is happy to announce that our expert, Prof. Jerzy Krupka, has developed resonators specifically designed for the measurements of electrical properties of  graphene deposited on small 10 mm x 10 mm dielectric substrates at microwave frequencies (around 13 GHz). They are presented in the figures to the left. Such resonators are now commercially available through QWED.

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RESONATORS
SOFTWARE FOR ELECTROMAGNETIC DESIGN
HARDWARE FOR MEASUREMENT OF ELECTROMAGNETIC PROPERTIES OF MATERIALS